| 摘要 |
An eddy-current defectoscope includes micro-controller, high-frequency clock generator, eddy-current transducer. Additionally it includes chip for measurement of complex resistance to measuring input of which input of eddy-current transducer is connected, its output is connected to measuring input of chip for measurement of complex resistance. At that clock generator is connected to the input of timing signals of micro-controller and chip for measurement of complex resistance, and information outputs of the chip for measurement of complex resistance are connected to information inputs of micro-controller, and microcontroller is connected to control panel and display. |
