发明名称 GRINDING METHOD OF WAFER BACK SIDE
摘要 PURPOSE: A method for removing the deformation of a wafer is provided to prevent the generation of a scratch due to a wafer process. CONSTITUTION: A wafer(10) is loaded into a grinding chamber. A grinding device(20) having metal particles(21) is placed in the grinding chamber. The grinding device polishes the rear surface of the wafer in order to remove the warpage of the wafer.
申请公布号 KR20130029471(A) 申请公布日期 2013.03.25
申请号 KR20110092725 申请日期 2011.09.15
申请人 GIL, MYUNG GUN;KIM, DONG JUN 发明人 GIL, MYUNG GUN;KIM, DONG JUN
分类号 H01L21/304 主分类号 H01L21/304
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