发明名称 |
RESISTANCE CHANGE NONVOLATILE MEMORY DEVICE, SEMICONDUCTOR DEVICE, AND METHOD OF OPERATING RESISTANCE CHANGE NONVOLATILE MEMORY DEVICE |
摘要 |
<p>PURPOSE: A resistance change nonvolatile memory device, a semiconductor device, and a method for operating resistance change nonvolatile memory device are provided to secure high-speed switching operation by using a step for forming a filament. CONSTITUTION: A first electrode(14) and a second electrode(11) are formed on a resistance change part(18). A resistance change layer(13) changes resistance. A stability layer(12) forms a filament. The resistance change layer and the stability layer are made of different metal oxide.</p> |
申请公布号 |
KR20130029352(A) |
申请公布日期 |
2013.03.22 |
申请号 |
KR20120101758 |
申请日期 |
2012.09.13 |
申请人 |
RENESAS ELECTRONICS CORPORATION |
发明人 |
TERAI MASAYUKI |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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