发明名称 RESISTANCE CHANGE NONVOLATILE MEMORY DEVICE, SEMICONDUCTOR DEVICE, AND METHOD OF OPERATING RESISTANCE CHANGE NONVOLATILE MEMORY DEVICE
摘要 <p>PURPOSE: A resistance change nonvolatile memory device, a semiconductor device, and a method for operating resistance change nonvolatile memory device are provided to secure high-speed switching operation by using a step for forming a filament. CONSTITUTION: A first electrode(14) and a second electrode(11) are formed on a resistance change part(18). A resistance change layer(13) changes resistance. A stability layer(12) forms a filament. The resistance change layer and the stability layer are made of different metal oxide.</p>
申请公布号 KR20130029352(A) 申请公布日期 2013.03.22
申请号 KR20120101758 申请日期 2012.09.13
申请人 RENESAS ELECTRONICS CORPORATION 发明人 TERAI MASAYUKI
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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