发明名称 WAFER AND IDENTIFICATION MARK FORMING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a wafer on which an identification mark indicating the crystal orientation of the wafer is formed without cutting off or notching the wafer periphery and to provide an identification mark forming method. <P>SOLUTION: A wafer made of a crystal includes a device forming region where a device is formed on the surface, and a circumferential excessive region where the device forming region is surrounded. Inside a wafer in the circumferential excessive region, an identification mark is formed which indicates the crystal orientation of the wafer. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013055139(A) 申请公布日期 2013.03.21
申请号 JP20110190893 申请日期 2011.09.01
申请人 DISCO ABRASIVE SYST LTD 发明人 KONDO KOICHI
分类号 H01L21/02;B23K26/00 主分类号 H01L21/02
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