| 摘要 |
<p>Provided is a plate glass inspection device in which, in an inspection for glass defects that occur continuously, the inspection speed is increased without compromising the necessary inspection accuracy, the device configuration is kept simple, and the device cost is minimized. A plate glass inspection device for inspecting a plurality of plate glasses, the plate glass inspection device being provided with: a detector for detecting the defect candidate range of a first plate glass, and the defect candidate range of a second plate glass which is different from the first plate glass; and a determination unit for comparing the position of the defect candidate range of the first plate glass and the position of the defect candidate range of the second plate glass, and determining, on the basis of the result of the comparison, whether or not there is a defect that is continuous between the first plate glass and the second plate glass.</p> |
