发明名称 STENCIL FOR STRAIN ANALYZING
摘要 PURPOSE: A stencil for analyzing strain, which analyzes moldability of a thin film material, is provided to accurately analyze moldability of a thin film material by preventing the inflow of foreign materials. CONSTITUTION: A stencil for analyzing strain comprises a lattice part(100) and a body(200). The lattice part has a sheet configuration, in which multiple grooves(110) formed to be penetrated, and is formed into the lattice form. The body portion is formed on the girth of the lattice part. The body portion is the sheet configuration supporting the lattice part. The body portion is made of the transparent material. The body portion comprises a boundary face(210) along the girth of the lattice part.
申请公布号 KR101246435(B1) 申请公布日期 2013.03.21
申请号 KR20100039970 申请日期 2010.04.29
申请人 发明人
分类号 G01B11/14;G01B21/32;G01N1/32;G01N21/956 主分类号 G01B11/14
代理机构 代理人
主权项
地址