发明名称 INTEGRATED CIRCUIT STRUCTURE HAVING SELECTIVELY FORMED METAL CAP
摘要 Methods of forming an integrated circuit structure utilizing a selectively formed and at least partially oxidized metal cap over a gate, and associated structures. In one embodiment, a method includes providing a precursor structure including a transistor having a metal gate; forming an etch stop layer over an exposed portion of the metal gate; at least partially oxidizing the etch stop layer; and forming a dielectric layer over the at least partially oxidized etch stop layer.
申请公布号 US2013069161(A1) 申请公布日期 2013.03.21
申请号 US201113233064 申请日期 2011.09.15
申请人 YANG CHIH-CHAO;HORAK DAVID V.;KOBURGER, III CHARLES W.;PONOTH SHOM;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 YANG CHIH-CHAO;HORAK DAVID V.;KOBURGER, III CHARLES W.;PONOTH SHOM
分类号 H01L21/768;H01L23/48 主分类号 H01L21/768
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