| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a storage device which can efficiently perform failure analysis by trace information even when there are a plurality of failure causes. <P>SOLUTION: A storage device comprises: a state information monitoring unit which creates trace information by adding time information to state information of a sequencer of a control unit; a monitoring unit which receives trace information from the state information monitoring unit and stores the trace information in time series in a memory; and the memory which comprises a trace information storage unit. When an error occurs, the trace information stored in the trace information storage unit is to be stored in a trace information storage unit in a non-volatile memory B. <P>COPYRIGHT: (C)2013,JPO&INPIT |
