| 摘要 |
A method for characterizing jitter of an internal clock signal of a circuit may include generating a series of samples of the internal clock signal by a reference clock signal, comparing the word formed by the N most recent samples of the series to an N-bit pattern, where N is an integer greater than, or equal to 2, and incrementing a first counter if the word complies with the pattern. The method may also include incrementing a second counter when the count of the first counter reaches a first threshold X1, and incrementing a third counter when the count of the first counter reaches a second threshold different from the first. The method may include calculating an average p and a standard deviationσof a Gaussian density curve as a function of the counts reached in the second and third counters.
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