发明名称 |
METHOD FOR MANUFACTURING NON-VOLATILE MEMORY ELEMENT, AND NON-VOLATILE MEMORY ELEMENT |
摘要 |
<p>This invention includes: a step (c) for forming a first electroconductive film (105') on a substrate; steps (d, e) for forming a first metal oxide layer (106x"), a second metal oxide layer (106y") having a different level of oxygen deficiency to that of the first metal oxide layer, and a second electroconductive film (107'), on the first electroconductive film (105'); a step (f) for patterning the second electroconductive film (107') and thereby forming a second electrode (107); a step (g) for patterning the first metal oxide layer (106x") and the second metal oxide layer (106y"), and thereby forming a variable resistance layer (106); a step (h) for removing the side section of the variable resistance layer (106) to a position further inward relative to the outline of the second electrode (107) on a plane parallel to the principal surface of the substrate; and a step (i) for patterning the first electroconductive film (105') and thereby forming a first electrode (105) after, or in the same step as, the step for removing the side section of the variable resistance layer (106).</p> |
申请公布号 |
WO2013038641(A1) |
申请公布日期 |
2013.03.21 |
申请号 |
WO2012JP05718 |
申请日期 |
2012.09.10 |
申请人 |
PANASONIC CORPORATION;MURASE, HIDEAKI;MIKAWA, TAKUMI;KAWASHIMA, YOSHIO;HIMENO, ATSUSHI |
发明人 |
MURASE, HIDEAKI;MIKAWA, TAKUMI;KAWASHIMA, YOSHIO;HIMENO, ATSUSHI |
分类号 |
H01L27/105;H01L45/00;H01L49/00 |
主分类号 |
H01L27/105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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