发明名称 Illumination-source shape definition in optical lithography
摘要 A method and system are described for determining lithographic processing conditions for a lithographic process. After obtaining input, a first optimization is made for illumination source and mask design under conditions of allowing non-rectangular sub-resolution assist features. Thereafter, mask design is optimized in one or more further optimizations for which only rectangular sub-resolution assist features are allowed. The latter results in good lithographic processing while limiting the complexity of the mask design.
申请公布号 EP2570854(A1) 申请公布日期 2013.03.20
申请号 EP20110181654 申请日期 2011.09.16
申请人 IMEC;SONY CORPORATION;ASML NETHERLANDS BV 发明人 IWASE, KAZUYA;DE BISSCHOP, PETER
分类号 G03F7/20;G03F1/36 主分类号 G03F7/20
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