发明名称 |
Illumination-source shape definition in optical lithography |
摘要 |
A method and system are described for determining lithographic processing conditions for a lithographic process. After obtaining input, a first optimization is made for illumination source and mask design under conditions of allowing non-rectangular sub-resolution assist features. Thereafter, mask design is optimized in one or more further optimizations for which only rectangular sub-resolution assist features are allowed. The latter results in good lithographic processing while limiting the complexity of the mask design. |
申请公布号 |
EP2570854(A1) |
申请公布日期 |
2013.03.20 |
申请号 |
EP20110181654 |
申请日期 |
2011.09.16 |
申请人 |
IMEC;SONY CORPORATION;ASML NETHERLANDS BV |
发明人 |
IWASE, KAZUYA;DE BISSCHOP, PETER |
分类号 |
G03F7/20;G03F1/36 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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