发明名称 IMPEDANCE MEASUREMENT APPARATUS
摘要 PURPOSE: An impedance measurement device is provided to accurately measure the impedance of a first impedance element by surely suppressing the current flowing in a second impedance element to zero. CONSTITUTION: A circuit board test device(21) measures and tests the impedance of one among first through third impedance elements(Z1-Z3) installed at a circuit board under test(22) in order to construct a delta circuit. Multiple sets of the first through third impedance elements constructing a delta circuit are installed at the circuit board under test. The first through third impedance elements are equipped with connection parts of one side and the other side, and construct a delta circuit by being electrically connected by first through third conductive paths(L1-L3). The one side connection part of the first impedance element and the other side connection part of the second impedance element are electrically connected by the first conductive path. The one side connection part of the second impedance element and the other side connection part of the third impedance element are electrically connected by the second conductive path. The one side connection part of the third impedance element and the other side connection part of the first impedance element are electrically connected by the third conductive path.
申请公布号 KR20130028858(A) 申请公布日期 2013.03.20
申请号 KR20120097433 申请日期 2012.09.04
申请人 NIDEC-READ CORPORATION 发明人 YAMASHITA MUNEHIRO
分类号 G01R27/16 主分类号 G01R27/16
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