发明名称 Scan test circuit, and method and program for designing same
摘要 Flip-flops 201 to 206 constitute a scan path shift register. During shift mode operation, a clock signal CLK is supplied to clock terminals of the flip-flops 201, 203, and 205, a signal obtained by having an inverted clock control circuit 303 reverse the phase of the clock signal CLK is supplied to clock terminals of the flip-flops 202 and 206, and a normal/inverted clock control circuit 404 supplies a signal having the same phase as the clock signal CLK to a clock terminal of the flip-flop 204 having no sufficient setup time.
申请公布号 US8402329(B2) 申请公布日期 2013.03.19
申请号 US20100789594 申请日期 2010.05.28
申请人 NIIYAMA KEITAROU;SAKANO NORIYUKI;TAKAHASHI YUUKI;RENESAS ELECTRONICS CORPORATION 发明人 NIIYAMA KEITAROU;SAKANO NORIYUKI;TAKAHASHI YUUKI
分类号 G01R31/28 主分类号 G01R31/28
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