发明名称 APPARATUS FOR EVALUATING A THERMOELECTRIC DEVICE
摘要 PURPOSE: An apparatus for evaluating a thermoelectric device is provided to measure Seebeck coefficient, conductivity, and thermal conductivity at the same time by using a thermoelectric performance parameter. CONSTITUTION: A heating plate assembly includes temperature sensors. The heating plate assembly is placed in a main vacuum chamber. A temperature controller(340) is connected to the heating plate assembly. A data collector(310) gathers thermoelectric performance parameter information. A calculation unit(300) computes a thermoelectric performance index by using the thermoelectric performance parameter information. [Reference numerals] (AA) 30 temperatures, currents, and voltages sensing, PID control, and output control; (BB) DB based data processing and automatic data processing and calculation; (CC) Statistical processing and experimental condition determination
申请公布号 KR20130028377(A) 申请公布日期 2013.03.19
申请号 KR20110091886 申请日期 2011.09.09
申请人 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE 发明人 KWON, SU YONG;KIM, YONG GYOO
分类号 H01L35/34;G01N25/00;G01R31/00 主分类号 H01L35/34
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