| 摘要 |
<p num="1"><br/><br/><br/>The invention relates to a device for checking or calibrating the angle-<br/>dependent alignment of a reference structure on a high-precision test-piece <br/>(1). The device comprises a plinth (2), a retainer piece (3), mounted such as <br/>to rotate about a retainer piece axis (4), for retaining the test-piece (1) <br/>and a measuring piece (5) with a measuring piece bearing unit (6), for the <br/>rotational mounting of the measuring piece (5), about a measuring piece axis <br/>(7). An optical unit (8) is mounted on the measuring piece (5), for receiving <br/>at least one test-piece beam (10, 10a, 10b, 10c, 10d), interacting with the <br/>reference structure on the test piece (1), running essentially in a measuring <br/>plane (11). The measuring piece bearing unit (6) is arranged to one side of <br/>the measuring plane (11) or on the measuring plane (11). The measuring piece <br/>(5) comprises a base form which is for a large part axially symmetrical with <br/>the measuring piece axis (7) and encompasses or surrounds the intersection of <br/>the measuring piece axis (7) with the retainer piece axis (4) on the measuring <br/>plane (11) and hence also encompasses or surrounds the test-piece (1).<br/>
|
