发明名称 |
Method and system for subnet defect diagnostics through fault compositing |
摘要 |
A method and system for subnet defect diagnostics through fault compositing is disclosed. A testing apparatus generates callout data for an integrated circuit device under test. A computer received the callout data, which includes a list of faults. Each fault of the list of faults has associated with it one or more failures and/or conflicts. In order to explain the failures, two or more faults are selected and composited, yielding a composite fault having a composite conflict count. The composite fault is assigned a score based on the composite conflict count, which score determines a candidate composite that best explains the faults of the list of faults. This procedure may be repeated to explain all the failures. |
申请公布号 |
US8402421(B2) |
申请公布日期 |
2013.03.19 |
申请号 |
US20100903035 |
申请日期 |
2010.10.12 |
申请人 |
BARTENSTEIN THOMAS WEBSTER;SWENTON JOSEPH MICHAEL;CADENCE DESIGN SYSTEMS, INC. |
发明人 |
BARTENSTEIN THOMAS WEBSTER;SWENTON JOSEPH MICHAEL |
分类号 |
G06F17/50;G06F9/455;G06F11/00;G06F11/22 |
主分类号 |
G06F17/50 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|