发明名称 METHOD AND APPARATUS FOR EVALUATING DETERIORATION IN LIGHT TRANSMISSIVE MATERIAL
摘要 <P>PROBLEM TO BE SOLVED: To acceleratedly evaluate a light transmissive material, in which a highly accelerated life deterioration phenomenon of the light transmissive material is confirmed using a Highly Accelerated Stress Test device (HAST device). <P>SOLUTION: An apparatus for evaluating deterioration in a light transmissive material for performing a deterioration test of transparency of a test object light transmissive material 930 disposed under hostile environment in a HAST device 500, includes: a reference-system light measurement path S1 in which no light transmissive material is placed in a light transmission path between a light-emitting element unit 600-1 and a light-receiving unit 600-3 that are disposed in the HAST device 500; and an evaluation-system light measurement path S2 in which the test object light transmissive material 930 is placed in a light transmission path between a light-emitting element unit 600-2 and a light-receiving unit 600-4 that are disposed in the HAST device. The apparatus acceleratedly evaluates the light transmissive material by a sequential comparison of changes in respective light receiving currents of the reference system and the evaluation system. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013050316(A) 申请公布日期 2013.03.14
申请号 JP20110186895 申请日期 2011.08.30
申请人 HIRAYAMA SEISAKUSHO:KK 发明人 NAGASAWA TOSHIKATSU
分类号 G01N17/00 主分类号 G01N17/00
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