发明名称 DIE BONDER AND SEMICONDUCTOR MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a die bonder capable of reliably picking up a die, and provide a semiconductor manufacturing method. <P>SOLUTION: The die bonder or the semiconductor manufacturing method comprises: imaging dicing grooves surrounding dies on a wafer at a first illumination intensity to obtain first imaging data; detecting the dicing grooves from the first imaging data; performing rough positioning for setting a roughly positioned position of a predetermined position of the die; imaging the die at a second illumination intensity to obtain second imaging data; clipping a searching area from the second imaging data based on the roughly positioned position; matching the searching area with a predetermined template to set a definitely positioned position of the predetermined position; correcting a pickup position of a bonding head based on the definitely positioned position; and picking up the die from the wafer to bond the die to a substrate. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013051278(A) 申请公布日期 2013.03.14
申请号 JP20110187607 申请日期 2011.08.30
申请人 HITACHI HIGH-TECH INSTRUMENTS CO LTD 发明人 KOBASHI HIDEHARU;HORIUCHI AYAJI
分类号 H01L21/52;H01L21/301 主分类号 H01L21/52
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