发明名称 |
DIE BONDER AND SEMICONDUCTOR MANUFACTURING METHOD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a die bonder capable of reliably picking up a die, and provide a semiconductor manufacturing method. <P>SOLUTION: The die bonder or the semiconductor manufacturing method comprises: imaging dicing grooves surrounding dies on a wafer at a first illumination intensity to obtain first imaging data; detecting the dicing grooves from the first imaging data; performing rough positioning for setting a roughly positioned position of a predetermined position of the die; imaging the die at a second illumination intensity to obtain second imaging data; clipping a searching area from the second imaging data based on the roughly positioned position; matching the searching area with a predetermined template to set a definitely positioned position of the predetermined position; correcting a pickup position of a bonding head based on the definitely positioned position; and picking up the die from the wafer to bond the die to a substrate. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013051278(A) |
申请公布日期 |
2013.03.14 |
申请号 |
JP20110187607 |
申请日期 |
2011.08.30 |
申请人 |
HITACHI HIGH-TECH INSTRUMENTS CO LTD |
发明人 |
KOBASHI HIDEHARU;HORIUCHI AYAJI |
分类号 |
H01L21/52;H01L21/301 |
主分类号 |
H01L21/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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