发明名称 MEMORY SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a high-quality memory system. <P>SOLUTION: A memory system 1 comprises: a nonvolatile semiconductor storage part 2 that can hold data; temperature measurement parts 9a and 9b that measure the temperature of the semiconductor storage part 2; a temperature variable part 8 that varies the temperature of the semiconductor storage part 2; and a control circuit 5 that includes a transfer part for transferring data, which is received from a host device 11, to the semiconductor storage part 2, a temperature storage part for storing temperature information from the temperature measurement parts 9a and 9b, and a temperature control part for controlling the temperature variable part 8 on the basis of the temperature information stored in the temperature storage part. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013050818(A) 申请公布日期 2013.03.14
申请号 JP20110187862 申请日期 2011.08.30
申请人 TOSHIBA CORP 发明人 ICHIDA MAKOTO;SUKEGAWA HIROSHI;MATSUKAWA NAOHIRO
分类号 G06F12/16;G11C16/02 主分类号 G06F12/16
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