| 摘要 |
<p>An eddy current testing device (50) is provided. The eddy current testing device includes an eddy current array probe (70) including a tip portion, and a plurality of differential side mount coils (130, 132, 134, 136, 138, 140, 142, 144) positioned at least partially within the tip portion (110) of the eddy current array probe, the plurality of differential side mount coils flexibly coupled together to form an array (128) of coils.</p> |
