发明名称 SEMICONDUCTOR ELEMENT AND IMAGING SYSTEM
摘要 <p>A method for manufacturing a semiconductor device, by which a multiple quantum well structure having a large number of pairs can be efficiently grown while maintaining good crystalline quality, and the semiconductor device, are provided. The semiconductor device manufacturing method of the present invention includes a step of forming a multiple quantum well structure 3 having 50 or more pairs of group III-V compound semiconductor quantum wells. In the step of forming the multiple quantum well structure 3, the multiple quantum well structure is formed by metal-organic vapor phase epitaxy using only metal-organic sources (all metal-organic source MOVPE).</p>
申请公布号 KR20130026494(A) 申请公布日期 2013.03.13
申请号 KR20137002252 申请日期 2010.07.07
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 FUJII KEI;ISHIZUKA TAKASHI;AKITA KATSUSHI;NAGAI YOUICHI;TANABE TATSUYA
分类号 H01L31/10;H01L27/14 主分类号 H01L31/10
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