发明名称 SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME
摘要 PURPOSE: A semiconductor device and a manufacturing method thereof are provided to prevent a stringer by forming an etch stop layer after a peripheral circuit gate electrode is formed in a peripheral circuit region. CONSTITUTION: A device isolation layer(102) defining an active region(104) is formed on a substrate(100). A buried gate pattern is formed on the substrate in a first direction to fill trenches across the active region and the device isolation layer. An etch stop layer(120) and a first insulation layer(122) are successively formed on the substrate. A bit line structure is formed on the first insulation layer and is extended in a second direction across the buried gate pattern. The bit line structure includes a barrier pattern(130), a metal pattern(132), and a capping pattern(134). A second insulation layer(140) covers the bit line structure.
申请公布号 KR20130026266(A) 申请公布日期 2013.03.13
申请号 KR20110089771 申请日期 2011.09.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, YOON JAE;SHIN, CHUL HO;LEE, CHAN MIN;KIM, NAM GUN
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
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