发明名称 |
ASSEMBLY FOR PROVIDING AN ALIGNED STACK OF TWO OR MORE MODULES AND A LITHOGRAPHY SYSTEM OR A MICROSCOPY SYSTEM COMPRISING SUCH AN ASSEMBLY. |
摘要 |
The invention relates to a charged particle system for processing a target surface with at least one charged particle beam. The system comprises an optical column with a beam generator module for generating a plurality of charged particle beams, a beam modulator module for switching on and off said plurality of beams and a beam projector module for projecting beams or subbeams on said target surface. The system further comprises a frame supporting each of said modules in a fixed position and alignment elements for aligning at least one of beams and/or subbeams with a downstream module element. |
申请公布号 |
NL2007392(C) |
申请公布日期 |
2013.03.13 |
申请号 |
NL20112007392 |
申请日期 |
2011.09.12 |
申请人 |
MAPPER LITHOGRAPHY IP B.V. |
发明人 |
KAPPELHOF PIETER |
分类号 |
G03F7/20;H01J37/067;H01J37/317 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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