发明名称 Signal margin improvement for read operations in a cross-point memory array
摘要 A configuration for biasing conductive array lines in a two-terminal cross-point memory array is disclosed. The configuration includes applying a read voltage to a selected X-conductive array line while applying an un-select voltage thru a biasing element to a remaining plurality of un-selected X-conductive array lines. A plurality of Y-conductive array lines are initially biased to some voltage (e.g., 0V) and then allowed to float unbiased after a predetermined amount of time has passed, some event has occurred, or both. As one example the event that triggers the floating of the plurality of Y-conductive array lines can be the read voltage reaching a predetermined magnitude. The array can be formed BEOL and include a plurality of two-terminal memory cells with each memory cell including a memory element and optionally a non-ohmic device (NOD) that are electrically in series with each other and with the two terminals of the memory cell.
申请公布号 US8395929(B2) 申请公布日期 2013.03.12
申请号 US201213449011 申请日期 2012.04.17
申请人 SIAU CHANG HUA;UNITY SEMICONDUCTOR CORPORATION 发明人 SIAU CHANG HUA
分类号 G11C11/00 主分类号 G11C11/00
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