| 摘要 |
A method for excess measurements of surface concentration of chlorophyll in plant leaves relates to optics, in particular to measuring engineering, and can be used at development of high-accuracy measuring devices for measurement of surface concentration of chlorophyll in leaves of plants of different kinds. The method is based on formation of normalized by value of powerfluxes of optical radiation with wavelengthsand, and transmission bands, where, those are directed to the sample of plant leaf under investigation. With those fluxes of optical radiation with wavelengthsandin same way additionally and in turn one radiates a standard sample of plant leaf with known by value concentrationof chlorophyll and with normalized by value areaat anglechosen before. Powers of reflected by same angle and decayed fluxes of optical radiation with wavelengthsandare converted to voltages within pass bands, those are amplified and measured, values of voltages obtained are stored. And conclusion is made on surface concentration of chlorophyll for the plant leaf under investigation by equations of measurements obtained in implicit form:,where.Specific surface concentration is determined by the equation of the values. At presence of random noise and interferences at output of measuring channel before determination of real value of concentration of chlorophyll in plant leaf each of voltages is additionally measured 9-50 times, with determination of average statistical values of those and dispersions or uncertainty, with application to obtain the end result. The technical result is in increase of accuracy of determination of surface concentration of chlorophyll in plant leaves due to automatic exclusion of systematic errors of measurement, and at repetitive measurements decrease of random component of error as well. |
