发明名称 DEVICE ISOLATION STRUCTURE, SEMICONDUCTOR DEVICE HAVING THE SAME, AND METHOD OF FORMING THE SAME
摘要 <p>PURPOSE: A semiconductor device and a manufacturing method thereof are provided to minimize interference between adjacent cells by reducing a coupling effect between the adjacent cells. CONSTITUTION: A device isolation structure(20) is arranged on the substrate and defines an active region and includes a bottom insulation pattern(11a), a top insulation pattern(21a), and a gap region(17). The gap region is located between the bottom insulation pattern and the top insulation pattern. The bottom insulation pattern includes a silicon oxide layer. The top insulation pattern includes a buried insulation recess pattern and a spacer recess pattern(15c) arranged on both sidewalls of the buried insulation recess pattern.</p>
申请公布号 KR20130025204(A) 申请公布日期 2013.03.11
申请号 KR20110088583 申请日期 2011.09.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, DAE WOONG;YANG, JUN KYU;KIM, HONG SUK;HAN, TAE JONG
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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