发明名称 |
DEVICE ISOLATION STRUCTURE, SEMICONDUCTOR DEVICE HAVING THE SAME, AND METHOD OF FORMING THE SAME |
摘要 |
<p>PURPOSE: A semiconductor device and a manufacturing method thereof are provided to minimize interference between adjacent cells by reducing a coupling effect between the adjacent cells. CONSTITUTION: A device isolation structure(20) is arranged on the substrate and defines an active region and includes a bottom insulation pattern(11a), a top insulation pattern(21a), and a gap region(17). The gap region is located between the bottom insulation pattern and the top insulation pattern. The bottom insulation pattern includes a silicon oxide layer. The top insulation pattern includes a buried insulation recess pattern and a spacer recess pattern(15c) arranged on both sidewalls of the buried insulation recess pattern.</p> |
申请公布号 |
KR20130025204(A) |
申请公布日期 |
2013.03.11 |
申请号 |
KR20110088583 |
申请日期 |
2011.09.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, DAE WOONG;YANG, JUN KYU;KIM, HONG SUK;HAN, TAE JONG |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|