| 摘要 |
FIELD: physics.SUBSTANCE: invention relates to determining reference marks of points of interest in an area (10, 20) of the surface of a component (100), involving establishing close contact in said area of a surface test sample (11, 21), which is a thin and sufficiently elastic layer, in order to match the shape of the area, the thin layer having lines of electroconductive material. As the eddy current probe (30) passes, a significant and characteristic line signal is transmitted along the path, said characteristic signal corresponding to the reference mark of the point of interest, defined in such manner in said zone. The invention discloses: a surface test sample, a method of determining reference marks of points of interest in an area of the surface of a component, a method of conducting automatic control study of identical metal components and use of the surface test sample, use of the method of determining reference marks of points of interest in an area on the surface of a component, use of said method for automatic control study during nondestructive inspection of electroconductive components.EFFECT: invention enables to optimise the path and inclination angle of an eddy current probe scanning an area of the inspected component.19 cl, 3 dwg |
