发明名称 |
SYSTEM AND METHOD FOR TESTING LED |
摘要 |
PURPOSE: A system for testing an LED and a method thereof is provided to save time and cost for testing the LED. CONSTITUTION: A system for testing an LED comprises a heater(100) which changes the temperature of an LED; a temperature measuring part(200) which measures the temperature changes of the LED by the heater; and a quality testing part(300) which tests the quality of the LED. |
申请公布号 |
KR20130023422(A) |
申请公布日期 |
2013.03.08 |
申请号 |
KR20110086161 |
申请日期 |
2011.08.29 |
申请人 |
AP TECH CO., LTD. |
发明人 |
JU, JAE CHEOL;PARK, CHUN YONG;KWON, OH CHUL |
分类号 |
G01R31/26;G01J1/00;H01L21/66 |
主分类号 |
G01R31/26 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|