发明名称 SYSTEM AND METHOD FOR TESTING LED
摘要 PURPOSE: A system for testing an LED and a method thereof is provided to save time and cost for testing the LED. CONSTITUTION: A system for testing an LED comprises a heater(100) which changes the temperature of an LED; a temperature measuring part(200) which measures the temperature changes of the LED by the heater; and a quality testing part(300) which tests the quality of the LED.
申请公布号 KR20130023422(A) 申请公布日期 2013.03.08
申请号 KR20110086161 申请日期 2011.08.29
申请人 AP TECH CO., LTD. 发明人 JU, JAE CHEOL;PARK, CHUN YONG;KWON, OH CHUL
分类号 G01R31/26;G01J1/00;H01L21/66 主分类号 G01R31/26
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