发明名称 PLASMA REACTOR HAVING DUAL INDUCTIVELY COUPLED PLASMA SOURCE
摘要 PURPOSE: A plasma reactor including a dual induction coupling plasma source is provided to effectively execute a bosh process by uniformly processing a wafer substrate. CONSTITUTION: A plasma reactor(10) includes a plasma reactor body(12) and a dual induction coupling plasma source(20). The plasma reactor includes a substrate processing area and a dielectric window which touches the substrate processing area. The dual induction coupling plasma source includes a first antenna providing a first induced electromotive force for generating plasma in a core area of a substrate processing area through a dielectric window and a second antenna providing a second induced electromotive force for generating the plasma in a boundary area of the substrate processing area. The dual induction coupling plasma source repetitively executes an evaporation process and an engraving process and generates a penetrated silicon path for a processed substrate. [Reference numerals] (42,46,52) Impedance matcher; (60) Vacuum pump
申请公布号 KR20130024453(A) 申请公布日期 2013.03.08
申请号 KR20110087908 申请日期 2011.08.31
申请人 GEN CO., LTD. 发明人 KIM, GYOO DONG;KANG, SUNG YONG;CHOI, DAI KYU
分类号 H05H1/46;H01L21/205;H01L21/3065 主分类号 H05H1/46
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