发明名称 METHOD FOR OPTIMIZING PLASMA PROCESS
摘要 PURPOSE: A method for optimizing a plasma process is provided to monitor plasma reaction in real time by using a reference spectrum and a measurement spectrum. CONSTITUTION: A reference spectrum is obtained from plasma reaction in a chamber(S10). A generalized measurement spectrum and a generalized reference standard value are calculated(S40). The generalized measurement spectrum is compared with the generalized reference spectrum(S50). The generalized measurement value is compared with the generalized reference standard value(S70). Whether a process parameter of plasma reaction is changed or a chamber is cleaned(S80) is determined. [Reference numerals] (AA) Start; (BB,DD,FF) No; (CC,EE,GG) Yes; (HH) End; (S10) Obtaining a reference spectrum; (S100) Seasoning step; (S20) Calculating and storing a generalized reference spectrum and a generalized reference standard value; (S30) Obtaining a measurement spectrum; (S40) Calculating a generalized measurement spectrum and a generalized measurement standard value; (S50) Is the generalized measurement spectrum matched with the generalized reference spectrum?; (S60) Is the monitoring of a plasma reaction terminated?; (S70) Is the generated measurement standard value matched with the generalized reference spectrum?; (S80) Changing a process parameter; (S90) Cleaning a chamber, exchanging parts
申请公布号 KR20130024527(A) 申请公布日期 2013.03.08
申请号 KR20110088026 申请日期 2011.08.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, SANG WUK;SHIN, KYOUNG SUB;BAEK, KYE HYUN;LEE, BRAD H.
分类号 H01L21/205;H01L21/3065;H01L21/66 主分类号 H01L21/205
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