发明名称 |
METHOD FOR OPTIMIZING PLASMA PROCESS |
摘要 |
PURPOSE: A method for optimizing a plasma process is provided to monitor plasma reaction in real time by using a reference spectrum and a measurement spectrum. CONSTITUTION: A reference spectrum is obtained from plasma reaction in a chamber(S10). A generalized measurement spectrum and a generalized reference standard value are calculated(S40). The generalized measurement spectrum is compared with the generalized reference spectrum(S50). The generalized measurement value is compared with the generalized reference standard value(S70). Whether a process parameter of plasma reaction is changed or a chamber is cleaned(S80) is determined. [Reference numerals] (AA) Start; (BB,DD,FF) No; (CC,EE,GG) Yes; (HH) End; (S10) Obtaining a reference spectrum; (S100) Seasoning step; (S20) Calculating and storing a generalized reference spectrum and a generalized reference standard value; (S30) Obtaining a measurement spectrum; (S40) Calculating a generalized measurement spectrum and a generalized measurement standard value; (S50) Is the generalized measurement spectrum matched with the generalized reference spectrum?; (S60) Is the monitoring of a plasma reaction terminated?; (S70) Is the generated measurement standard value matched with the generalized reference spectrum?; (S80) Changing a process parameter; (S90) Cleaning a chamber, exchanging parts
|
申请公布号 |
KR20130024527(A) |
申请公布日期 |
2013.03.08 |
申请号 |
KR20110088026 |
申请日期 |
2011.08.31 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, SANG WUK;SHIN, KYOUNG SUB;BAEK, KYE HYUN;LEE, BRAD H. |
分类号 |
H01L21/205;H01L21/3065;H01L21/66 |
主分类号 |
H01L21/205 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|