| 摘要 |
The present invention relates to a pin for a semiconductor chip test, and to a socket for a semiconductor chip test including same, and more particularly, to a pin for a semiconductor chip test, and to a socket for a semiconductor chip test including same, which: improve test reliability by means of a movement toward a semiconductor chip being natural and contact with a test terminal being reliable; reduce costs by means of a low amount of wear occurring upon contact with a semiconductor chip terminal and by flipping and using one side of a contact terminal when the opposite side has been worn down, thereby preventing damage to components by reducing the number of components. |
