METHOD OF COLLECTING AND PROCESSING ELECTRON DIFFRACTION DATA

摘要

One aspect of the present disclosure is a method for determining an atomic pair distribution function of a sample using electron diffraction. According to this method, the sample is exposed to a beam of electrons. The sample causes electrons to scatter from the beam, the scattered electrons are detected, and a diffraction pattern of the sample is produced. Either the sample or the electron beam can be manipulated to limit the exposure of the sample to the electron beam. Limiting the sample's exposure to the electron beam can reduce damage to the sample. Finally, the signal is analyzed to determine the atomic pair distribution function of the sample.