发明名称
摘要 A semiconductor apparatus includes a first substrate and a second substrate located over a first portion of the first substrate and separated from the first substrate by a buried layer. The semiconductor apparatus also includes an epitaxial layer located over a second portion of the first substrate and isolated from the second substrate. The semiconductor apparatus further includes a first transistor formed at least partially in the second substrate and a second transistor formed at least partially in or over the epitaxial layer. The second substrate and the epitaxial layer have bulk properties with different electron and hole mobilities. At least one of the transistors is configured to receive one or more signals of at least about 5V. The first substrate could have a first crystalline orientation, and the second substrate could have a second crystalline orientation.
申请公布号 JP2013508951(A) 申请公布日期 2013.03.07
申请号 JP20120534387 申请日期 2010.10.15
申请人 发明人
分类号 H01L21/8238;H01L21/336;H01L21/76;H01L21/762;H01L27/08;H01L27/092;H01L27/12;H01L29/786 主分类号 H01L21/8238
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