发明名称 Wafer Heating and Temperature Control by Backside Fluid Injection
摘要 Methods, systems, and computer programs are presented for processing a substrate in a processing chamber which includes a first chamber and a second chamber. A first surface of the substrate is exposed to the first chamber and a second surface of the substrate is exposed to the second chamber. One method includes an operation for applying a first fluid to the first surface of the substrate, where the first fluid is at a first temperature. Further, the method includes another operation for applying a second fluid to the second surface of the substrate, where the second fluid is at a second temperature. During processing of the substrate, the second temperature is higher than the first temperature, and the second fluid heats the substrate.
申请公布号 US2013059260(A1) 申请公布日期 2013.03.07
申请号 US201213665702 申请日期 2012.10.31
申请人 MOORING BEN;PARKS JOHN;HYMES DIANE J. 发明人 MOORING BEN;PARKS JOHN;HYMES DIANE J.
分类号 F27D3/00 主分类号 F27D3/00
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