发明名称 |
BIT LINE IN SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME |
摘要 |
PURPOSE: A bit line of a semiconductor device and a manufacturing method thereof are provided to secure a sufficient distance between the bit line and a storage node contact plug by additionally forming a spacer with a lower dielectric constant than a nitride layer except a spacer film between the bit line and the storage node contact. CONSTITUTION: A junction area is formed on both substrates(11) of a buried gate(15) and is classified into a storage contact node and a bit line contact node. An open part simultaneously opens the adjacent storage contact node. An undoped silicon containing layer(22) fills the open part on the storage node contact. A damascene pattern exposes the bit line contact node. A spacer film(25) is formed on a sidewall of the damascene pattern. A bit line(26) fills a part of the damascene pattern.
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申请公布号 |
KR20130022957(A) |
申请公布日期 |
2013.03.07 |
申请号 |
KR20110086027 |
申请日期 |
2011.08.26 |
申请人 |
SK HYNIX INC. |
发明人 |
AHN, TAE HANG |
分类号 |
H01L21/8242;H01L21/28;H01L27/108 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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