发明名称 |
SEMICONDUCTOR DEVICE WITH AIR GAP SPACER AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PURPOSE: A semiconductor device including an air gap spacer and a manufacturing method thereof are provided to reduce parasitic capacitance between a bit line and a storage node contact plug by forming an air gap between the bit line and the storage node contact plug. CONSTITUTION: A device isolation layer(22) is formed on a semiconductor substrate(21). A plurality of active regions(23) include a bit line contact region and a storage node contact region. A storage node contact plug(29A,29B) is formed on the storage node contact region. A bit line(36) separates the storage node contact plug. An air gap(38) and a bit line spacer(35) are formed between the bit line and the storage node contact plug. A bit line hard mask layer(37) is formed on the bit line.
|
申请公布号 |
KR20130022872(A) |
申请公布日期 |
2013.03.07 |
申请号 |
KR20110085854 |
申请日期 |
2011.08.26 |
申请人 |
SK HYNIX INC. |
发明人 |
YEOM, SEUNG JIN;LEE, HYO SEOK |
分类号 |
H01L27/108;H01L21/8242 |
主分类号 |
H01L27/108 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|