发明名称 SEMICONDUCTOR DEVICE WITH AIR GAP SPACER AND METHOD FOR MANUFACTURING THE SAME
摘要 PURPOSE: A semiconductor device including an air gap spacer and a manufacturing method thereof are provided to reduce parasitic capacitance between a bit line and a storage node contact plug by forming an air gap between the bit line and the storage node contact plug. CONSTITUTION: A device isolation layer(22) is formed on a semiconductor substrate(21). A plurality of active regions(23) include a bit line contact region and a storage node contact region. A storage node contact plug(29A,29B) is formed on the storage node contact region. A bit line(36) separates the storage node contact plug. An air gap(38) and a bit line spacer(35) are formed between the bit line and the storage node contact plug. A bit line hard mask layer(37) is formed on the bit line.
申请公布号 KR20130022872(A) 申请公布日期 2013.03.07
申请号 KR20110085854 申请日期 2011.08.26
申请人 SK HYNIX INC. 发明人 YEOM, SEUNG JIN;LEE, HYO SEOK
分类号 H01L27/108;H01L21/8242 主分类号 H01L27/108
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