发明名称 NONVOLATILE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 A nonvolatile memory device includes gate electrodes three dimensionally arranged on a semiconductor substrate, a semiconductor pattern extending from the semiconductor substrate and crossing sidewalls of the gate electrodes, a metal liner pattern formed between the semiconductor pattern and formed on a top surface and a bottom surface of each of the gate electrodes, and a charge storage layer formed between the semiconductor pattern and the metal liner pattern.
申请公布号 US2013059432(A1) 申请公布日期 2013.03.07
申请号 US201213667618 申请日期 2012.11.02
申请人 SAMSUNG ELECTRONICS CO., LTD.;SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE SUNWOO;LEE SANGWOO;LEE CHANGWON;LEE JEONGGIL
分类号 H01L21/28;H01L21/20 主分类号 H01L21/28
代理机构 代理人
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