发明名称 APPEARANCE INSPECTING APPARATUS
摘要 An appearance inspection device for inspecting the appearance of test objects, comprising: a first and second conveying means 21 and 22a for conveying the test objects; a back/front reversal means 23 for turning over the front and back surfaces of the test objects being conveyed by the first conveying means 21 and supplying the test objects to the second conveying means 22a; a plurality of image-pickup means 30b and 30c for capturing images of each test object from upper oblique directions while the test objects are conveyed by the first and second conveying means 21 and 22a; and a defect detection means for detecting the presence of defects in the test objects based on image data captured by the image-pickup means 30b and 30c. This appearance inspection device makes it possible to reliably and readily inspect the entire appearance of the test objects.
申请公布号 EP2157422(A4) 申请公布日期 2013.03.06
申请号 EP20080752150 申请日期 2008.04.25
申请人 QUALICAPS CO., LTD. 发明人 YAGYU, MOTOHIRO;KASAI, KENICHI;SATO, KEN;YASUI, JUNSUKE;NAGAO, AKIRA;ISHIDA, TETSUHISA
分类号 G01N21/85;B65G47/248;B65G47/30;B65G47/86;G01N21/84 主分类号 G01N21/85
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