发明名称 PROBE PIN FOR A SEMICONDUCTOR PROCESS
摘要 PURPOSE: A probe pin for a semiconductor process is provided to save the processing time and costs from processing to coupling. CONSTITUTION: A probe pin for a semiconductor process includes a body forming unit(100), an elastic body forming unit(200), and a lead contact pin forming unit(300). A pair of the body forming units is formed. The elastic body forming unit is interposed between the pair of body forming units and is integrally extended. The lead contact pin forming unit is extended from each pair of the body forming units, and two ends of the lead contact pin forming unit are oriented in opposite directions.
申请公布号 KR20130021859(A) 申请公布日期 2013.03.06
申请号 KR20110084379 申请日期 2011.08.24
申请人 MICRO CONTACT SOLUTION CO., LTD. 发明人 IKEYA KIYOKAZU
分类号 G01R1/067;G01R31/26;H01L21/66 主分类号 G01R1/067
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