发明名称 Method of manufacturing semiconductor device
摘要 There is provided a method of manufacturing a semiconductor device including: preparing a semiconductor substrate, forming a first insulating layer, a first redistribution layer, a second insulating layer, a second redistribution layer, and at least one of first processing, in which, after the first electrically conductive material is filled in the first opening to form a first via interconnect, the first redistribution layer is formed on the first insulating layer with the first electrically conductive material such that the first redistribution layer is electrically connected to the first via interconnect; or second processing, in which, after the second electrically conductive material is filled in the second opening to form a second via interconnect, the second redistribution layer is formed on the second insulating layer with the second electrically conductive material such that the second redistribution layer is electrically connected to the second via interconnect.
申请公布号 US8389406(B2) 申请公布日期 2013.03.05
申请号 US20100656629 申请日期 2010.02.05
申请人 SAMESHIMA HIDEYUKI;ONO TOMOO;LAPIS SEMICONDUCTOR CO., LTD. 发明人 SAMESHIMA HIDEYUKI;ONO TOMOO
分类号 H01L21/44 主分类号 H01L21/44
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