发明名称 Method for producing a semiconductor wafer
摘要 Semiconductor wafers are produced by a process of: a) providing a semiconductor wafer by cutting a silicon ingot into wafers; b) rounding the edge of the wafer, so that the wafer comprises plane surfaces on the frontside and backside and rounded oblique surfaces in the edge region; c) polishing the frontside and backside of the wafer, the frontside being polished by chemical-mechanical polishing using a polishing pad which is free of abrasive fixed in the polishing pad; backside polishing being carried out in three steps, using a polishing pad containing fixed abrasive which is pressed onto the backside of the wafer, a polishing agent free of solids introduced between the polishing pad and the backside of the wafer in the first step, a polishing agent containing abrasive being introduced in the second and third steps, a polishing pressure of 8-15 psi in the first and second steps being reduced to 0.5-5 psi in the third step.
申请公布号 US8389409(B2) 申请公布日期 2013.03.05
申请号 US20100778198 申请日期 2010.05.12
申请人 SCHWANDNER JUERGEN;SILTRONIC AG 发明人 SCHWANDNER JUERGEN
分类号 H01L21/302;B24B37/04 主分类号 H01L21/302
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