发明名称 Method for manufacturing oxide thin film transistor and method for manufacturing display device
摘要 A method for manufacturing an oxide thin film transistor includes the steps of forming an oxide semiconductor active layer by a deposition process. In the deposition process, a total flow rate of a gas is more than 100 standard cubic centimeters per minute and an electric power is in a range from 1.5 kilowatts to 10 kilowatts. The oxide thin film transistor manufactured by the above methods has advantages of low leakage currents, high electron mobility, and excellent temperature stability. The present invention also provides a method for manufacturing a display device. The display quality of the display device can be improved.
申请公布号 US8389310(B2) 申请公布日期 2013.03.05
申请号 US20100699063 申请日期 2010.02.03
申请人 SHINN TED-HONG;WANG HENRY;SHU FANG-AN;TSAI YAO-CHOU;E INK HOLDINGS INC. 发明人 SHINN TED-HONG;WANG HENRY;SHU FANG-AN;TSAI YAO-CHOU
分类号 H01L21/00;H01L51/40 主分类号 H01L21/00
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