发明名称 Transistor with dopant-bearing metal in source and drain
摘要 A transistor and method of manufacturing thereof. A gate dielectric and gate are formed over a workpiece, and the source and drain regions of a transistor are recessed. The recesses are filled with a dopant-bearing metal, and a low-temperature anneal process is used to form doped regions within the workpiece adjacent the dopant-bearing metal regions. A transistor having a small effective oxide thickness and a well-controlled junction depth is formed.
申请公布号 US8390080(B2) 申请公布日期 2013.03.05
申请号 US20080245526 申请日期 2008.10.03
申请人 LI HONG-JYH;CHAUDHARY NIRMAL;INFINEON TECHNOLOGIES AG 发明人 LI HONG-JYH;CHAUDHARY NIRMAL
分类号 H01L21/02;H01L21/225;H01L21/28;H01L21/336;H01L21/8242;H01L29/51;H01L29/76;H01L29/78;H01L29/786 主分类号 H01L21/02
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