发明名称 Methods of manufacturing oxide semiconductor thin film transistor
摘要 Provided is a method of manufacturing an oxide semiconductor thin film transistor using a transparent oxide semiconductor as a material for a channel. The method of manufacturing the oxide semiconductor thin film transistor includes forming a passivation layer on a channel layer and performing an annealing process for one hour or more at a temperature of about 100° C. or above.
申请公布号 US8389344(B2) 申请公布日期 2013.03.05
申请号 US20100659148 申请日期 2010.02.26
申请人 JUNG JISIM;PARK YOUNGSOO;LEE SANGYOON;KIM CHANGJUNG;KIM TAESANG;KWON JANGYEON;SON KYUNGSEOK;SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG JISIM;PARK YOUNGSOO;LEE SANGYOON;KIM CHANGJUNG;KIM TAESANG;KWON JANGYEON;SON KYUNGSEOK
分类号 H01L21/00 主分类号 H01L21/00
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