发明名称 |
Method and apparatus for testing RFID tags for mass production |
摘要 |
A testing system and method for testing glass-mounted RFID tags such as tags mounted on vehicle windows. A testing carrier for use in a test chamber simulates the effect on the tag of the mounting glass. The test chamber and carrier are calibrated by first mounting the tag on the test carrier and making sensitivity measurements and then mounting the tag on glass that is representative of the actual production environment. Comparisons are made between the two measurements and calibration factors are derived to compensate for differences between the actual mounting glass and the test carrier. The test carrier is designed to provide uniform pressure against the tag to minimize any distortions that would alter the sensitivity of the tag. |
申请公布号 |
US8392137(B2) |
申请公布日期 |
2013.03.05 |
申请号 |
US20100705083 |
申请日期 |
2010.02.12 |
申请人 |
YOUN TAI WON;AMTECH SYSTEMS, LLC |
发明人 |
YOUN TAI WON |
分类号 |
G01D18/00 |
主分类号 |
G01D18/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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