| 摘要 |
Processes and systems for use in reverse engineering integrated circuits determine functionality through analysis of junctions responding to external radiation. Semiconductor devices include a number of p-n junctions grouped according to interconnected functional cells. A surface of the semiconductor device is illuminated by radiation, e.g., by a laser or an electron beam, producing electron-hole pairs. Such pairs give rise to detectable currents that can be used to determine locations of irradiated junctions. By scanning a surface of the device in such a manner, a layout of at least some of the junctions can be obtained. The layout can be used to identify functional cells according to a lookup process. By selectively providing input test vectors to the device and repeating the scanning process, first level functional cells can be identified. A netlist of interconnected functional cells can thus be determined and expanded by repeating the process with different test vectors. |
