发明名称 DEVICE TEST SYSTEM AND DEVICE TEST METHOD
摘要 <P>PROBLEM TO BE SOLVED: To shorten a time period required for testing. <P>SOLUTION: A device test system for testing a target device has: a first simulator serving as a first device communicating with the target device; a second simulator serving as a second device communicating with the target device; and a two-dimensional table that can be read out and written by the first simulator and the second simulator and that holds a parameter. For each of one or more control messages included in a scenario depending on a purpose of testing, the first simulator and the second simulator calculate the parameter while reading from and writing to the two-dimensional table. The first simulator sets the parameter to the target device, and then, the first simulator and the second simulator start or stop data communication. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013046223(A) 申请公布日期 2013.03.04
申请号 JP20110182635 申请日期 2011.08.24
申请人 NEC ENGINEERING LTD 发明人 AKUTAGAWA TAKUO;HAYAKAWA YUKITAKA
分类号 H04W24/06;H04B17/00;H04W88/08 主分类号 H04W24/06
代理机构 代理人
主权项
地址