发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 A method of manufacturing a semiconductor device includes forming a bit line on a substrate comprising an active region; forming an interlayer insulating layer covering the bit line on the substrate; forming a first hole at a location of the active region through the interlayer insulating layer; forming a dummy contact layer by filling the first hole; forming a mold layer on the interlayer insulating layer and the dummy contact layer; forming a second hole at a location of the dummy contact layer through the mold layer; removing the dummy contact layer in the first hole through the second hole; forming an epitaxial layer on a portion of the active region, which is exposed at a lower surface of the first hole; and forming a lower electrode on internal surfaces of the first hole and the second hole.
申请公布号 US2013052787(A1) 申请公布日期 2013.02.28
申请号 US201213494328 申请日期 2012.06.12
申请人 LEE KWANG-WOOK;LEE SANG-JUN;HWANG IN-SEAK;JEON IN-SANG;GWAK BYOUNG-YONG;AN HO-KYUN;SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE KWANG-WOOK;LEE SANG-JUN;HWANG IN-SEAK;JEON IN-SANG;GWAK BYOUNG-YONG;AN HO-KYUN
分类号 H01L21/02;H01L21/20 主分类号 H01L21/02
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