发明名称 LOW COST ERROR-BASED PROGRAM TESTING APPARATUS AND METHOD
摘要 A low cost error-based program testing apparatus and method are provided. The testing apparatus according to an embodiment of the present invention generates error programs by adding errors to a test target program, selects a test target error program associated with test data among the error programs using error information obtained through the error addition, receives the test data to execute the test target error program, and tests for presence/absence of the errors. Accordingly, it is possible to reduce a text execution time and testing costs.
申请公布号 US2013055027(A1) 申请公布日期 2013.02.28
申请号 US201213550118 申请日期 2012.07.16
申请人 MA YU-SEUNG;KIM SEON-TAE;ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 MA YU-SEUNG;KIM SEON-TAE
分类号 G06F11/263 主分类号 G06F11/263
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