Tip for generating high, strong localized electromagnetic field strength, used in scanning near-field optical microscope, has Bragg reflectors that are arranged at predetermined distance from apex portion and shaft

摘要

The tip (1) has Bragg reflectors (4,8) that are arranged at predetermined distance (A) from apex portion (2) and shaft (3). The Bragg reflectors are arranged extending along the axis of symmetry. The reflector structures (6a-6d) are arranged over the periphery (5) of the tip. Independent claims are included for the following: (1) optical scanning device; and (2) manufacturing method for tip.